gems, advanced testing, analytical testing, chemistry, PIXE

When charged particles pass through matter, X-rays are emitted. Each element has a characteristic spectrum and hence the X-rays give information about which elements are present and also their concentrations. A method, usually called PIXE, based on this principle has recently found extensive use in elemental analysis, especially for trace element studies. The first comprehensive review of the basic physics, and modern applications, of proton-induced x-ray emission. The physics section and the applications section are relatively independent, making for easy reference. The authors discuss instrument design, and how to handle specimens. They then survey the wide range of applications to which proton-induced x-ray emission has been put. Illustrated.