Four Treasures Reference Database
Record No. 5498

Reflectance infrared spectroscopy in gemology

Journal Article
Martin, F., Mérigoux, H. and Zecchini, P. (1989) Reflectance infrared spectroscopy in gemology. Gems & Gemology, Vol. 25, No. 4, Winter, pp. 226–231.
ISBN/ISSN: 0016626X  |  Sinkankas/Born No.: NIS / NIB  |  RWHL
FTIR, gemology, gems
External reflectance infrared spectroscopy permits a very rapid and nondestructive determination of the species of a mineral. It is particularly useful with polished gems in that it requires no more than plac-ing the stone, loose or mounted, on a reflection de-vice in the infrared spectrometer and observing the recorded spectrum. Therefore, compared to the classi-cal methods of physical measurement such as refrac-tive index, specific gravity, and the like, reflectance spectroscopy provides a much faster means of estab-lishing the species of the gem and, in some cases, whether it is natural or synthetic.